ISO/AWI 24689

Surface chemical analysis — Rule sets for automatic retrieval of information from the X-Ray photoelectron spectroscopy survey spectrum — Identification and use of significant minor features in the XPS survey spectrum. ISO/AWI 24689

Current stage: 20.00 New project registered in TC/SC work programme Jan 9, 2024

Originator: ISO

Owner: ISO/TC 201/SC 3 Data management and treatment

Type: International Standard

See attached document for proposed scope and purpose

IN_DEVELOPMENT
ISO/AWI 24689
20.00 New project registered in TC/SC work programme
Jan 9, 2024