IEC 62860:2013 ED1

Test methods for the characterization of organic transistors and materials

Publication date:   Aug 5, 2013

General information

60.60 Standard published   Aug 5, 2013

IEEE

TC 113 Nanotechnology for electrotechnical products and systems

International Standard

07.030   Physics. Chemistry | 07.120   Nanotechnologies

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IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors.
Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor

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PUBLISHED
IEC 62860:2013 ED1
60.60 Standard published
Aug 5, 2013