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IEC 61445:2012 ED1

Digital Test Interchange Format (DTIF) IEC 61445:2012 ED1

Publication date:   Jun 21, 2012

General information

60.60 Standard published   Jun 21, 2012

IEEE

TC 91

International Standard

25.040.01   Industrial automation systems in general | 35.060   Languages used in information technology

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Scope

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.

Life cycle

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PUBLISHED
IEC 61445:2012 ED1
60.60 Standard published
Jun 21, 2012