IEC 62132-1:2015 ED2

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions IEC 62132-1:2015 ED2

Publication date:   Oct 29, 2015

General information

60.60 Standard published   Oct 29, 2015

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 1 GHz has been deleted from the title;
b) frequency step above 1 GHz has been added in Table 2 in 7.4.1;
c) IC performance classes in 8.3 have been modified;
d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 62132-1:2006 ED1

NOW

PUBLISHED
IEC 62132-1:2015 ED2
60.60 Standard published
Oct 29, 2015