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IEC 62007-2:2009 ED2

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods IEC 62007-2:2009 ED2

Publication date:   Jan 26, 2009

General information

60.60 Standard published   Jan 26, 2009

IEC

TC 86/SC 86C

International Standard

31.080.01   Semiconductor devices in general | 31.260   Optoelectronics. Laser equipment | 33.180.01   Fibre optic systems in general

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Scope

IEC 62007-2:2009 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic digital communication systems and subsystems. This edition includes the following significant technical changes with respect to the previous edition:
- descriptions related to analogue characteristics have been removed;
- some definitions and terms have been revised for harmonisation with other standards originating from SC 86C.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 62007-2:1997/AMD1:1998 ED1

ABANDON
IEC 62007-2/AMD2 ED1

WITHDRAWN
IEC 62007-2:1997 ED1

NOW

PUBLISHED
IEC 62007-2:2009 ED2
60.60 Standard published
Jan 26, 2009

REVISED BY

IN_DEVELOPMENT
IEC 62007-2 ED3