IEC 60749-13:2002/COR1:2003 ED1
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere IEC 60749-13:2002/COR1:2003 ED1
General information
99.60
Withdrawal effective
Feb 15, 2018
WPUB
IEC
TC 47
International Standard
31.080.01
Semiconductor devices in general
Scope
Modification of the validity date: now put at 2007.
Life cycle
NOW
WITHDRAWN
IEC 60749-13:2002/COR1:2003 ED1
99.60
Withdrawal effective
Feb 15, 2018