IEC 62276:2005 ED1

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods IEC 62276:2005 ED1

Publication date:   May 30, 2005

General information

99.60 Withdrawal effective   Oct 19, 2012

IEC

TC 49

International Standard

31.140   Piezoelectric devices

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Revised

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Scope

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62276:2001 ED1

NOW

WITHDRAWN
IEC 62276:2005 ED1
99.60 Withdrawal effective
Oct 19, 2012

REVISED BY

WITHDRAWN
IEC 62276:2012 ED2