IEC 60749:1996+AMD1:2000+AMD2:2001 CSV ED2.2

Semiconductor devices - Mechanical and climatic test methods

Publication date:   Apr 10, 2002

95.99 Withdrawal of Standard   May 21, 2004

General information

95.99 Withdrawal of Standard   May 21, 2004

IEC

TC 47 Semiconductor devices

International Standard

31.080.01   Semiconductor devices in general

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Scope

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.
Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

Life cycle

NOW

WITHDRAWN
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV ED2.2
95.99 Withdrawal of Standard
May 21, 2004