IEC 62132-4:2006 ED1

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

Publication date:   Feb 21, 2006

General information

60.60 Standard published   Feb 21, 2006

IEC

TC 47/SC 47A Integrated circuits

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements.

This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.

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PUBLISHED
IEC 62132-4:2006 ED1
60.60 Standard published
Feb 21, 2006

REVISED BY

ABANDON
IEC 62132-4 ED2