Revised
Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This consolidated version consists of the third edition (1999) and its amendment 1 (2001). Therefore, no need to order amendment in addition to this publication.
WITHDRAWN
IEC 60115-1:1999+AMD1:2001 CSV ED3.1
99.60
Withdrawal effective
Jul 21, 2008
WITHDRAWN
IEC 60115-1:2008 ED4