IEC 62132-1:2006 ED1

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions

Publication date:   Jan 19, 2006

General information

99.60 Withdrawal effective   Oct 29, 2015


TC 47/SC 47A Integrated circuits

International Standard

31.200   Integrated circuits. Microelectronics



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This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and set-up, as well as the test procedures and content of the test reports. A test method comparison table is included in Annex A to assist in selecting the appropriate measurement method(s).

This standard describes general conditions required to obtain a quantitative measure of immunity of ICs in a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes.

Measurement of the injected voltages and currents, together with the responses of the ICs tested at controlled conditions, yields information about the potential immunity of the IC to conducted and radiated RF disturbances in a given application.

Life cycle


IEC 62132-1:2006 ED1
99.60 Withdrawal effective
Oct 29, 2015


IEC 62132-1:2015 ED2