IEC 60749-23:2004 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Publication date:   Feb 23, 2004

General information

60.60 Standard published   Feb 23, 2004

IEC

TC 47 Semiconductor devices

International Standard

31.080.01   Semiconductor devices in general

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Published

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Scope

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Life cycle

PREVIOUSLY

Replaces
IEC PAS 62189:2000 ED1

NOW

PUBLISHED
IEC 60749-23:2004 ED1
60.60 Standard published
Feb 23, 2004

CORRIGENDA / AMENDMENTS

Amended by
IEC 60749-23:2004/AMD1:2011 ED1