IEC 60749-33:2004 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 33: Accelerated moisture resistance - Unbiased autoclave

Publication date:   Mar 9, 2004

General information

60.60 Standard published   Mar 9, 2004

IEC

TC 47 Semiconductor devices

International Standard

31.080.01   Semiconductor devices in general

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Scope

The unbiased autoclave test is performed to evaluate the moisture resistance integrity of non-hermetically packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, humidity and temperature under condensing conditions to accelerate moisture penetration through the external protective material or along the interface between the external protective material and the metallic conductors passing through it.

Life cycle

PREVIOUSLY

Replaces
IEC PAS 62172:2000 ED1

NOW

PUBLISHED
IEC 60749-33:2004 ED1
60.60 Standard published
Mar 9, 2004