IEC 62162 ED1

Test method C101 - Field-induced charged-device model test, Method for electrostatic discharge withstand thresholds of microelectronic components

General information

10.98 New project rejected   Apr 17, 2003

IEC

TC 47 Semiconductor devices

International Standard

Life cycle

NOW

ABANDON
IEC 62162 ED1
10.98 New project rejected
Apr 17, 2003