IEC 60749-10:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Publication date:   Apr 9, 2002

General information

60.60 Standard published   Apr 9, 2002

IEC

TC 47 Semiconductor devices

International Standard

31.080.01   Semiconductor devices in general

Buying

Published

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Scope

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.

The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

PREVIOUSLY

Replaces
IEC PAS 62186:2000 ED1

NOW

PUBLISHED
IEC 60749-10:2002 ED1
60.60 Standard published
Apr 9, 2002

CORRIGENDA / AMENDMENTS

Corrected by
IEC 60749-10:2002/COR1:2003 ED1

REVISED BY

IN_DEVELOPMENT
IEC 60749-10 ED2