IEC 60749-7:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Publication date:   Apr 9, 2002

General information

99.60 Withdrawal effective   Jun 17, 2011

IEC

TC 47 Semiconductor devices

International Standard

31.080.01   Semiconductor devices in general

Buying

Revised

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Scope

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

The contents of the corrigendum of August 2003 have been included in this copy.

Life cycle

NOW

WITHDRAWN
IEC 60749-7:2002 ED1
99.60 Withdrawal effective
Jun 17, 2011

CORRIGENDA / AMENDMENTS

Corrected by
IEC 60749-7:2002/COR1:2003 ED1

REVISED BY

PUBLISHED
IEC 60749-7:2011 ED2