IEC PAS 62207:2000 ED1
Hermeticity
Publication date:
Nov 28, 2000
95.99
Withdrawal of Standard
Jan 31, 2002
General information
95.99
Withdrawal of Standard
Jan 31, 2002
IEC
TC 47
Semiconductor devices
Publicly Available Specification
31.080.01
Semiconductor devices in general
Scope
Aims at determining the effectiveness of the seal of hermetically sealed solid-state devices.
The seal tests are considered nondestructive.
Life cycle
NOW
WITHDRAWN
IEC PAS 62207:2000 ED1
95.99
Withdrawal of Standard
Jan 31, 2002