IEC PAS 62207:2000 ED1

Hermeticity

Publication date:   Nov 28, 2000

95.99 Withdrawal of Standard   Jan 31, 2002

General information

95.99 Withdrawal of Standard   Jan 31, 2002

IEC

TC 47 Semiconductor devices

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

Replaced

Language in which you want to receive the document.

Scope

Aims at determining the effectiveness of the seal of hermetically sealed solid-state devices.
The seal tests are considered nondestructive.

Life cycle

NOW

WITHDRAWN
IEC PAS 62207:2000 ED1
95.99 Withdrawal of Standard
Jan 31, 2002

REVISED BY

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2