IEC PAS 62205:2000 ED1

High temperature storage life

Publication date:   Nov 28, 2000

95.99 Withdrawal of Standard   Jul 1, 2002

General information

95.99 Withdrawal of Standard   Jul 1, 2002

IEC

TC 47 Semiconductor devices

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Scope

Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.

Life cycle

NOW

WITHDRAWN
IEC PAS 62205:2000 ED1
95.99 Withdrawal of Standard
Jul 1, 2002

REVISED BY

WITHDRAWN
IEC 60749-6:2002 ED1