IEC PAS 62202:2000 ED1

Failure mechanisms and models for silicon semiconductor devices

Publication date:   Nov 28, 2000

95.99 Withdrawal of Standard   May 17, 2004

General information

95.99 Withdrawal of Standard   May 17, 2004

IEC

TC 47 Semiconductor devices

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Scope

Provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum-of-the-Failure-Rates method.

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NOW

WITHDRAWN
IEC PAS 62202:2000 ED1
95.99 Withdrawal of Standard
May 17, 2004