IEC PAS 62201:2000 ED1

A procedure for executing SWEAT

Publication date:   Nov 28, 2000

95.99 Withdrawal of Standard   May 17, 2004

General information

95.99 Withdrawal of Standard   May 17, 2004

IEC

TC 47 Semiconductor devices

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Scope

Describes an algorithm for executing of the Standard Wafer Level Electromigration Accelerated Test (SWEAT) on computer controlled instrumentation. The algorithm described represents one approach to the execution of SWEAT. Development and employment of other algorithms may produce satisfactory accelerated electromigration test results.

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WITHDRAWN
IEC PAS 62201:2000 ED1
95.99 Withdrawal of Standard
May 17, 2004