Replaced
Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.
WITHDRAWN
IEC PAS 62180:2000 ED1
99.60
Withdrawal effective
Oct 22, 2003
WITHDRAWN
IEC 60749-27:2003 ED1