IEC PAS 62180:2000 ED1

Electrostatic discharge (ESD) sensitivity testing machine model (MM) IEC PAS 62180:2000 ED1

Publication date:   Aug 22, 2000

General information

99.60 Withdrawal effective   Oct 22, 2003

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Scope

Establishes a standard procedure for testing and classifying microcircuits according to their susceptibility to damage or degradation by exposure to a defined machine Model (MM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable MM ESD test results so that accurate classifications can be performed.

Life cycle

NOW

WITHDRAWN
IEC PAS 62180:2000 ED1
99.60 Withdrawal effective
Oct 22, 2003

REVISED BY

WITHDRAWN
IEC 60749-27:2003 ED1