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IEC PAS 62175:2000 ED1

Marking permanency test method IEC PAS 62175:2000 ED1

Publication date:   Aug 24, 2000

95.99 Withdrawal of Standard   Jul 1, 2002

General information

95.99 Withdrawal of Standard   Jul 1, 2002

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

Replaced

Language in which you want to receive the document.

Scope

Verifies that the markings on solid state semiconductor devices will not become illegible when subjected to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.

Life cycle

NOW

WITHDRAWN
IEC PAS 62175:2000 ED1
95.99 Withdrawal of Standard
Jul 1, 2002

REVISED BY

WITHDRAWN
IEC 60749-9:2002 ED1