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IEC PAS 62172:2000 ED1

Accelerated moisture resistance - Unbiased autoclave IEC PAS 62172:2000 ED1

Publication date:   Aug 22, 2000

General information

99.60 Withdrawal effective   Mar 9, 2004

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

Replaced

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Scope

Aims at evaluating the moisture resistance of nonhermetic packaged solid state devices. Employs severe conditions of pressure, humidity and temperature that accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors that pass through it.

Life cycle

NOW

WITHDRAWN
IEC PAS 62172:2000 ED1
99.60 Withdrawal effective
Mar 9, 2004

REVISED BY

PUBLISHED
IEC 60749-33:2004 ED1