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IEC 61967-5:2003 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method IEC 61967-5:2003 ED1

Publication date:   Feb 13, 2003

General information

60.60 Standard published   Feb 13, 2003

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB).
Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.

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PUBLISHED
IEC 61967-5:2003 ED1
60.60 Standard published
Feb 13, 2003