EN IEC 61967-4:2021

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method EN IEC 61967-4:2021

Publication date:   Sep 16, 2021

General information

60.60 Standard published   Apr 30, 2021

CENELEC

CLC/SR 47A Integrated circuits

European Norm

31.200   Integrated circuits. Microelectronics

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<!-- NEW! -->IEC 61967-4:2021 is available as <a href="https://webstore.iec.ch/publication/68739">IEC 61967-4:2021 RLV</a> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.</br></br>IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition:

- frequency range of 150 kHz to 1 GHz has been deleted from the title;

- recommended frequency range for 1 Ω method has been reduced to 30 MHz;

- Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.

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PUBLISHED
EN IEC 61967-4:2021
60.60 Standard published
Apr 30, 2021