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EN IEC 63202-1:2019

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells EN IEC 63202-1:2019

Publication date:   Nov 14, 2019

General information

60.60 Standard published   Sep 20, 2019

CENELEC

CLC/TC 82 Solar photovoltaic energy systems

European Norm

27.160   Solar energy engineering

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Scope

IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.

The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.

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PUBLISHED
EN IEC 63202-1:2019
60.60 Standard published
Sep 20, 2019