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EN 62979:2017

Photovoltaic module - Bypass diode - Thermal runaway test EN 62979:2017

Publication date:   Feb 14, 2018

General information

60.60 Standard published   Oct 27, 2017

CENELEC

CLC/TC 82 Solar photovoltaic energy systems

European Norm

27.160   Solar energy engineering

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Scope

IEC 62979:2017(E) provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.

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PUBLISHED
EN 62979:2017
60.60 Standard published
Oct 27, 2017