60.60 Standard published Jun 14, 2002
CENELEC
CLC/SR 47A Integrated circuits
European Norm
31.200 Integrated circuits. Microelectronics
Published
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
PUBLISHED
EN 61967-4:2002
60.60
Standard published
Jun 14, 2002
PUBLISHED
EN IEC 61967-4:2021