EN 61967-5:2003

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method EN 61967-5:2003

Publication date:   Jul 30, 2004

General information

60.60 Standard published   Apr 23, 2003

CENELEC

CLC/SR 47A Integrated circuits

European Norm

31.200   Integrated circuits. Microelectronics

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Scope

Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.

Related legislation

Legislation related to this standard

2004/108/EC

Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC

2014/30/EU

Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)

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PUBLISHED
EN 61967-5:2003
60.60 Standard published
Apr 23, 2003