Projects

Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.

Nanomanufacturing - Key control characteristics - Part 6-33: Graphene - Defect density: Electron Energy Loss Spectroscopy (EELS)

20.99 WD approved for registration as CD

TC 113

Nanomanufacturing - key control characteristics – Part 6-34: Reduced graphene oxide - Reduction degree: Raman spectroscopy

20.99 WD approved for registration as CD

TC 113

Nanomanufacturing - Key control characteristics - Part 6-35: Graphene - Density: free-pouring, tapping, compressing method

30.60 Close of voting/ comment period

TC 113

Nanomanufacturing - Key control characterisctics - Part 6-36: Graphene-based materials - Evaluation of the reduction degree of graphene oxide - UV-Vis absorption spectroscopy

20.99 WD approved for registration as CD

TC 113

Nanomanufacturing - Key control characteristics - Part 6-4: Graphene-based materials - Surface conductance: non-contact microwave resonant cavity method

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-5: Graphene-based materials - Contact and sheet resistance: transmission line measurement

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-7: Graphene - Sheet resistance: van der Pauw method

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-8: Graphene - Sheet resistance: In-line four-point probe

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 6-9: Graphene-based material - Sheet resistance: Eddy current method

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 7-2: Nano-enabled photovoltaics - Device evaluation method for indoor light

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices - Analogue resistance change and resistance fluctuation: Electrical resistance measurement

60.60 Standard published

TC 113

IEC TS 62607-8-4 Nanomanufacturing - Key Control Characteristics - Part 8-4: Metal-oxide interfacial devices – Activation energy of electronic trap states: Low-frequency-noise spectroscopy

40.99 Full report circulated: DIS approved for registration as FDIS

TC 113

Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy

60.60 Standard published

TC 113

Nanomanufacturing - Key control characteristics - Nanomagnetic products - Magnetic field measurements: Magneto-optical indicator film technique

50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks

TC 113

Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings

60.60 Standard published

TC 113