Projects

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Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

90.93 Standard confirmed

ISO/TC 202/SC 4

Optics and photonics — Optical materials and components — Test method for refractive index of infrared optical materials

60.60 Standard published

ISO/TC 172/SC 3

Optics and photonics — Optical materials and components — Test method for homogeneity of optical glasses by laser interferometry

60.60 Standard published

ISO/TC 172/SC 3

Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance

90.92 Standard to be revised

ISO/TC 172/SC 5

Microscopes — Designation of microscope objectives — Part 1: Flatness of field/Plan

90.93 Standard confirmed

ISO/TC 172/SC 5

Microscopes — Designation of microscope objectives — Part 2: Chromatic correction

90.93 Standard confirmed

ISO/TC 172/SC 5

Microscopes — Designation of microscope objectives — Part 3: Spectral transmittance

90.93 Standard confirmed

ISO/TC 172/SC 5

Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics

60.00 Standard under publication

ISO/TC 172/SC 5

Microscopes — Minimum requirements for binocular tubes

90.93 Standard confirmed

ISO/TC 172/SC 5

Microscopes — Definition and measurement of illumination properties — Part 1: Image brightness and uniformity in bright field microscopy

90.93 Standard confirmed

ISO/TC 172/SC 5

Microscopes — Definition and measurement of illumination properties — Part 2: Illumination properties related to the colour in bright field microscopy

90.20 Standard under periodical review

ISO/TC 172/SC 5

Microscopes — Definition and measurement of illumination properties — Part 3: Incident light fluorescence microscopy with incoherent light sources

60.60 Standard published

ISO/TC 172/SC 5

Optics and photonics — Optical materials and components — Test method for homogeneity of infrared optical materials

90.93 Standard confirmed

ISO/TC 172/SC 3

Optics and photonics — Optical materials and components — Test method for striae in infrared optical materials

90.92 Standard to be revised

ISO/TC 172/SC 3

Optics and photonics — Optical materials and components — Test method for bubbles and inclusions in infrared optical materials

90.93 Standard confirmed

ISO/TC 172/SC 3

Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials

90.92 Standard to be revised

ISO/TC 202/SC 3

Optics and photonics — Spectral bands

90.93 Standard confirmed

ISO/TC 172

Optics and photonics — Environmental requirements — Test requirements for telescopic systems

90.93 Standard confirmed

ISO/TC 172/SC 4