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Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
90.93 Standard confirmed
Optics and photonics — Optical materials and components — Test method for refractive index of infrared optical materials
60.60 Standard published
Optics and photonics — Optical materials and components — Test method for homogeneity of optical glasses by laser interferometry
60.60 Standard published
Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance
90.92 Standard to be revised
Microscopes — Designation of microscope objectives — Part 1: Flatness of field/Plan
90.93 Standard confirmed
Microscopes — Designation of microscope objectives — Part 2: Chromatic correction
90.93 Standard confirmed
Microscopes — Designation of microscope objectives — Part 3: Spectral transmittance
90.93 Standard confirmed
Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
60.00 Standard under publication
Microscopes — Definition and measurement of illumination properties — Part 1: Image brightness and uniformity in bright field microscopy
90.93 Standard confirmed
Microscopes — Definition and measurement of illumination properties — Part 2: Illumination properties related to the colour in bright field microscopy
90.20 Standard under periodical review
Microscopes — Definition and measurement of illumination properties — Part 3: Incident light fluorescence microscopy with incoherent light sources
60.60 Standard published
Optics and photonics — Optical materials and components — Test method for homogeneity of infrared optical materials
90.93 Standard confirmed
Optics and photonics — Optical materials and components — Test method for striae in infrared optical materials
90.92 Standard to be revised
Optics and photonics — Optical materials and components — Test method for bubbles and inclusions in infrared optical materials
90.93 Standard confirmed
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
90.92 Standard to be revised
Optics and photonics — Environmental requirements — Test requirements for telescopic systems
90.93 Standard confirmed