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Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.
Fine bubble technology — Environmental applications — Part 1: Inspection method using online particle counter in dissolved air flotation (DAF) plant
60.60 Standard published
Amendment 5 - International Electrotechnical Vocabulary (IEV) - Part 113: Physics for electrotechnology
60.60 Standard published
Nanomanufacturing - Material specifications - Part 2-1: Carbon nanotube materials - Blank detail specification: Single-wall carbon nanotubes
20.99 WD approved for registration as CD
Nanomanufacturing - Key control characteristics - Part 3-1: Luminescent nanomaterials - Quantum efficiency
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 3-1: Luminescent nanomaterials - Quantum efficiency
30.99 CD approved for registration as DIS
Nanomanufacturing - Large scale manufacturing for nanoelectronics
60.60 Standard published
Nanomanufacturing - Large scale manufacturing for nanoelectronics
20.99 WD approved for registration as CD
Nanomanufacturing - Material specifications - Part 2-1: Single-wall carbon nanotubes - Blank detail specification
60.60 Standard published
Nanomanufacturing - Material specifications - Part 4-2: Luminescent nanomaterials - Detail specification for general lighting and display applications
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance
60.60 Standard published
IEC TS 62607-2-1 ED2: Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance: Four terminal method
20.99 WD approved for registration as CD
IEC TS 62607-2-2: Nanomanufacturing - Key control characteristics - Part 2-2: Nanomaterials - EM Shielding Effectiveness measurement for Near Field
50.00 Final text received or FDIS registered for formal approval
Nanomanufacturing - Key control characteristics - Part 2-4: Carbon nanotube materials - Test methods for determination of resistance of individual carbon nanotubes
60.60 Standard published
Nanomanufacturing - Key control characteristics - Part 2-5: Carbon nanotube materials - Mass density of vertically-aligned carbon nanotubes: X-ray absorption method
60.60 Standard published
62607-2-7: Nanomanufacturing - Key control characteristics - Part 2-7: Single wall carbon nanotubes - Semiconducting/metallic-ratio: Optical spectroscopy
20.99 WD approved for registration as CD
Nanomanufacturing - Key control characteristics - Part 3-3: Luminescent nanomaterials - Determination of fluorescence lifetime of semiconductor quantum dots using time correlated single photon counting (TCSPC)
60.60 Standard published